| |
| 2006 | ||
|---|---|---|
| 1 | EE | Shivarajiv Somisetty, Peter Ersland, Xinxing Yang, Jason Barrett: Reliability investigation and characterization of failure modes in Schottky diodes. Microelectronics Reliability 46(8): 1254-1260 (2006) |
| 1 | Peter Ersland | [1] |
| 2 | Shivarajiv Somisetty | [1] |
| 3 | Xinxing Yang | [1] |