| |
| 2003 | ||
|---|---|---|
| 2 | EE | F. Duan, R. Castagnetti, R. Venkatraman, O. Kobozeva, S. Ramesh: Design and Use of Memory-Specific Test Structures to Ensure SRAM Yield and Manufacturability. ISQED 2003: 119-124 |
| 2001 | ||
| 1 | H. Puchner, Y.-C. Liu, W. Kong, F. Duan, R. Castagnetti: Substrate Engineering to Improve Soft-Error-Rate Immunity for SRAM Technologies. Microelectronics Reliability 41(9-10): 1319-1324 (2001) | |
| 1 | R. Castagnetti | [1] [2] |
| 2 | O. Kobozeva | [2] |
| 3 | W. Kong | [1] |
| 4 | Y.-C. Liu | [1] |
| 5 | H. Puchner | [1] |
| 6 | S. Ramesh (Sethu Ramesh) | [2] |
| 7 | R. Venkatraman | [2] |