| |
| 2003 | ||
|---|---|---|
| 1 | EE | F. Duan, R. Castagnetti, R. Venkatraman, O. Kobozeva, S. Ramesh: Design and Use of Memory-Specific Test Structures to Ensure SRAM Yield and Manufacturability. ISQED 2003: 119-124 |
| 1 | R. Castagnetti | [1] |
| 2 | F. Duan | [1] |
| 3 | S. Ramesh (Sethu Ramesh) | [1] |
| 4 | R. Venkatraman | [1] |