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| 2001 | ||
|---|---|---|
| 1 | H. Puchner, Y.-C. Liu, W. Kong, F. Duan, R. Castagnetti: Substrate Engineering to Improve Soft-Error-Rate Immunity for SRAM Technologies. Microelectronics Reliability 41(9-10): 1319-1324 (2001) | |
| 1 | R. Castagnetti | [1] |
| 2 | F. Duan | [1] |
| 3 | Y.-C. Liu | [1] |
| 4 | H. Puchner | [1] |