| 1998 |
|---|
| 6 | EE | Robert L. Melcher,
Paul M. Alt,
Derek B. Dove,
Thomas M. Cipolla,
Evan G. Colgan,
Fuad E. Doany,
Kunio Enami,
Kenneth C. Ho,
Istvan Lovas,
Chandrasekhar Narayanaswami,
Robert S. Olyha Jr.,
Carl G. Powell,
Alan E. Rosenbluth,
James L. Sanford,
Eugene S. Schlig,
Rama N. Singh,
Takatoshi Tomooka,
Mitsuru Uda,
Kei-Hsiung Yang:
Design and fabrication of a prototype projection data monitor with high information content.
IBM Journal of Research and Development 42(3): 321-338 (1998) |
| 5 | EE | Evan G. Colgan,
Mitsuru Uda:
On-chip metallization layers for reflective light valves.
IBM Journal of Research and Development 42(3): 339-346 (1998) |
| 4 | EE | Evan G. Colgan,
Paul M. Alt,
Robert L. Wisnieff,
Peter M. Fryer,
Eileen A. Galligan,
William S. Graham,
Paul F. Greier,
Raymond R. Horton,
Harold Ifill,
Leslie C. Jenkins,
Richard A. John,
Richard I. Kaufman,
Yue Kuo,
Alphonso P. Lanzetta,
Kenneth F. Latzko,
Frank R. Libsch,
Shui-Chih Alan Lien,
Steven E. Millman,
Robert W. Nywening,
Robert J. Polastre,
Carl G. Powell,
Rick A. Rand,
John J. Ritsko,
Mary B. Rothwell,
John L. Staples,
Kevin W. Warren,
John S. Wilson,
Steven L. Wright:
A 10.5-in.-diagonal SXGA active-matrix display.
IBM Journal of Research and Development 42(3): 427-444 (1998) |
| 3 | EE | Evan G. Colgan,
Robert J. Polastre,
Masatomo Takeichi,
Robert L. Wisnieff:
Thin-film-transistor process-characterization test structures.
IBM Journal of Research and Development 42(3): 481-490 (1998) |
| 2 | EE | Hiroshi Takatsuji,
Evan G. Colgan,
Cyril Cabral Jr.,
James M. E. Harper:
Evaluation of Al(Nd)-alloy films for application to thin-film-transistor liquid crystal displays.
IBM Journal of Research and Development 42(3): 501-508 (1998) |
| 1995 |
|---|
| 1 | | Thomas J. Licata,
Evan G. Colgan,
James M. E. Harper,
Stephen E. Luce:
Interconnect fabrication processes and the development of low-cost wiring for CMOS products.
IBM Journal of Research and Development 39(4): 419-436 (1995) |
