C. Plossu
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2005
1
EE
N. Baboux
, C. Plossu,
P. Boivin
: Dynamic Fowler-Nordheim injection in EEPROM tunnel oxides at realistic time scales.
Microelectronics Reliability 45
(5-6): 911-914 (2005)
Coauthor
Index
1
N. Baboux
[
1
]
2
P. Boivin
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
