| 2006 |
|---|
| 3 | EE | Gerald Lucovsky,
H. Seo,
L. B. Fleming,
M. D. Ulrich,
J. Lüning,
Patrick Lysaght,
Gennadi Bersuker:
Intrinsic bonding defects in transition metal elemental oxides.
Microelectronics Reliability 46(9-11): 1623-1628 (2006) |
| 2005 |
|---|
| 2 | EE | Chadwin D. Young,
Gennadi Bersuker,
Yuegang Zhao,
Jeff J. Peterson,
Joel Barnett,
George A. Brown,
Jang H. Sim,
Rino Choi,
Byoung Hun Lee,
Peter Zeitzoff:
Probing stress effects in HfO2 gate stacks with time dependent measurements.
Microelectronics Reliability 45(5-6): 806-810 (2005) |
| 2001 |
|---|
| 1 | EE | Gennadi Bersuker,
Yongjoo Jeon,
Howard R. Huff:
Degradation of thin oxides during electrical stress.
Microelectronics Reliability 41(12): 1923-1931 (2001) |
