| |
| 2006 | ||
|---|---|---|
| 1 | EE | Gerald Lucovsky, H. Seo, L. B. Fleming, M. D. Ulrich, J. Lüning, Patrick Lysaght, Gennadi Bersuker: Intrinsic bonding defects in transition metal elemental oxides. Microelectronics Reliability 46(9-11): 1623-1628 (2006) |
| 1 | Gennadi Bersuker | [1] |
| 2 | L. B. Fleming | [1] |
| 3 | Gerald Lucovsky | [1] |
| 4 | J. Lüning | [1] |
| 5 | Patrick Lysaght | [1] |
| 6 | H. Seo | [1] |