Howard R. Huff
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2001
1
EE
Gennadi Bersuker
,
Yongjoo Jeon
, Howard R. Huff: Degradation of thin oxides during electrical stress.
Microelectronics Reliability 41
(12): 1923-1931 (2001)
Coauthor
Index
1
Gennadi Bersuker
[
1
]
2
Yongjoo Jeon
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
