| |
| 2005 | ||
|---|---|---|
| 1 | EE | Chadwin D. Young, Gennadi Bersuker, Yuegang Zhao, Jeff J. Peterson, Joel Barnett, George A. Brown, Jang H. Sim, Rino Choi, Byoung Hun Lee, Peter Zeitzoff: Probing stress effects in HfO2 gate stacks with time dependent measurements. Microelectronics Reliability 45(5-6): 806-810 (2005) |
| 1 | Joel Barnett | [1] |
| 2 | Gennadi Bersuker | [1] |
| 3 | George A. Brown | [1] |
| 4 | Rino Choi | [1] |
| 5 | Byoung Hun Lee | [1] |
| 6 | Jeff J. Peterson | [1] |
| 7 | Jang H. Sim | [1] |
| 8 | Peter Zeitzoff | [1] |
| 9 | Yuegang Zhao | [1] |