| |
| 2004 | ||
|---|---|---|
| 6 | EE | Baris Arslan, Alex Orailoglu: CircularScan: A Scan Architecture for Test Cost Reduction. DATE 2004: 1290-1295 |
| 5 | EE | Baris Arslan, Alex Orailoglu: Design space exploration for aggressive test cost reduction in CircularScan architectures. ICCAD 2004: 726-731 |
| 4 | EE | Baris Arslan, Ozgur Sinanoglu, Alex Orailoglu: Extending the Applicability of Parallel-Serial Scan Designs. ICCD 2004: 200-203 |
| 3 | EE | Baris Arslan, Alex Orailoglu: Test Cost Reduction Through A Reconfigurable Scan Architecture. ITC 2004: 945-952 |
| 2003 | ||
| 2 | EE | Baris Arslan, Alex Orailoglu: Extracting Precise Diagnosis of Bridging Faults from Stuck-at Fault Information. Asian Test Symposium 2003: 230-235 |
| 2002 | ||
| 1 | EE | Baris Arslan, Alex Orailoglu: Fault Dictionary Size Reduction through Test Response Superposition. ICCD 2002: 480- |
| 1 | Alex Orailoglu | [1] [2] [3] [4] [5] [6] |
| 2 | Ozgur Sinanoglu | [4] |