2007 |
4 | EE | Sandeep Jain,
Jais Abraham,
Srinivas Kumar Vooka,
Sumant Kale,
Amit Dutta,
Rubin A. Parekhji:
Enhancements in Deterministic BIST Implementations for Improving Test of Complex SOCs.
VLSI Design 2007: 339-344 |
2006 |
3 | EE | Jais Abraham,
Uday Goel,
Arun Kumar:
Multi-Cycle Sensitizable Transition Delay Faults.
VTS 2006: 306-313 |
2002 |
2 | EE | Karanth Shankaranarayana,
Soujanna Sarkar,
R. Venkatraman,
Shyam S. Jagini,
N. Venkatesh,
Jagdish C. Rao,
H. Udayakumar,
M. Sambandam,
K. P. Sheshadri,
S. Talapatra,
Parag Mhatre,
Jais Abraham,
Rubin A. Parekhji:
Challenges in the Design of a Scalable Data-Acquisition and Processing System-on-Silicon.
VLSI Design 2002: 781-788 |
2000 |
1 | | Jais Abraham,
Narayan Prasad,
Srinivasa Chakravarthy B. S.,
Ameet Bagwe,
Rubin A. Parekhji:
A framework to evaluate test tradeoffs in embedded core based systems-case study on TI's TMS320C27xx.
ITC 2000: 417-425 |