| |
| 2007 | ||
|---|---|---|
| 1 | EE | M. Alwan, B. Beydoun, K. Ketata, M. Zoaeter: Bias temperature instability from gate charge characteristics investigations in N-Channel Power MOSFET. Microelectronics Journal 38(6-7): 727-734 (2007) |
| 1 | M. Alwan | [1] |
| 2 | K. Ketata | [1] |
| 3 | M. Zoaeter | [1] |