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| 2008 | ||
|---|---|---|
| 4 | EE | Xingguo Xiong, Yu-Liang Wu, Wen-Ben Jone: Material Fatigue and Reliability of MEMS Accelerometers. DFT 2008: 314-322 |
| 2006 | ||
| 3 | EE | Xingguo Xiong, Yu-Liang Wu, Wen-Ben Jone: Reliability Analysis of Self-Repairable MEMS Accelerometer. DFT 2006: 236-244 |
| 2005 | ||
| 2 | EE | Xingguo Xiong, Yu-Liang Wu, Wen-Ben Jone: Design and Analysis of Self-Repairable MEMS Accelerometer. DFT 2005: 21-32 |
| 2004 | ||
| 1 | EE | Xingguo Xiong, Yu-Liang Wu, Wen-Ben Jone: A Dual-Mode Built-In Self-Test Technique for Capacitive MEMS Devices. VTS 2004: 148-153 |
| 1 | Wen-Ben Jone | [1] [2] [3] [4] |
| 2 | Yu-Liang Wu (David Yu-Liang Wu) | [1] [2] [3] [4] |