Charles S. Whitman

List of publications from the DBLP Bibliography Server - FAQ

2006

6 EE Charles S. Whitman: Erratum to "Reliability results of HBTs with an InGaP emitter" [Microelectron. Reliability 46 (2006) 1261-1271]. Microelectronics Reliability 46(12): 2159 (2006)

5 EE Charles S. Whitman, Terri M. Gilbert, Ann M. Rahn, Jennifer A. Antonell: Erratum to "Determining factors affecting ESD failure voltage using DOE" [Microelectron. Reliability 46 (2006) 1228-1237]. Microelectronics Reliability 46(12): 2160 (2006)

4 EE Charles S. Whitman, Terri M. Gilbert, Ann M. Rahn, Jennifer A. Antonell: Determining factors affecting ESD failure voltage using DOE. Microelectronics Reliability 46(8): 1228-1237 (2006)

3 EE Charles S. Whitman: Reliability results of HBTs with an InGaP emitter. Microelectronics Reliability 46(8): 1261-1271 (2006)

2005

2 EE Charles S. Whitman, Michael Meeder: Determining constant voltage lifetimes for silicon nitride capacitors in a GaAs IC process by a step stress method. Microelectronics Reliability 45(12): 1882-1893 (2005)

2003

1 EE Charles S. Whitman: Accelerated life test calculations using the method of maximum likelihood: an improvement over least squares. Microelectronics Reliability 43(6): 859-864 (2003)

2006
6	EE	Charles S. Whitman: Erratum to "Reliability results of HBTs with an InGaP emitter" [Microelectron. Reliability 46 (2006) 1261-1271]. Microelectronics Reliability 46(12): 2159 (2006)
5	EE	Charles S. Whitman, Terri M. Gilbert, Ann M. Rahn, Jennifer A. Antonell: Erratum to "Determining factors affecting ESD failure voltage using DOE" [Microelectron. Reliability 46 (2006) 1228-1237]. Microelectronics Reliability 46(12): 2160 (2006)
4	EE	Charles S. Whitman, Terri M. Gilbert, Ann M. Rahn, Jennifer A. Antonell: Determining factors affecting ESD failure voltage using DOE. Microelectronics Reliability 46(8): 1228-1237 (2006)
3	EE	Charles S. Whitman: Reliability results of HBTs with an InGaP emitter. Microelectronics Reliability 46(8): 1261-1271 (2006)
2005
2	EE	Charles S. Whitman, Michael Meeder: Determining constant voltage lifetimes for silicon nitride capacitors in a GaAs IC process by a step stress method. Microelectronics Reliability 45(12): 1882-1893 (2005)
2003
1	EE	Charles S. Whitman: Accelerated life test calculations using the method of maximum likelihood: an improvement over least squares. Microelectronics Reliability 43(6): 859-864 (2003)

Coauthor Index