Ann M. Rahn

2006
2	EE	Charles S. Whitman, Terri M. Gilbert, Ann M. Rahn, Jennifer A. Antonell: Erratum to "Determining factors affecting ESD failure voltage using DOE" [Microelectron. Reliability 46 (2006) 1228-1237]. Microelectronics Reliability 46(12): 2160 (2006)
1	EE	Charles S. Whitman, Terri M. Gilbert, Ann M. Rahn, Jennifer A. Antonell: Determining factors affecting ESD failure voltage using DOE. Microelectronics Reliability 46(8): 1228-1237 (2006)

Coauthor Index

1	Jennifer A. Antonell	[1] [2]
2	Terri M. Gilbert	[1] [2]
3	Charles S. Whitman	[1] [2]