| |
| 2006 | ||
|---|---|---|
| 2 | EE | Charles S. Whitman, Terri M. Gilbert, Ann M. Rahn, Jennifer A. Antonell: Erratum to "Determining factors affecting ESD failure voltage using DOE" [Microelectron. Reliability 46 (2006) 1228-1237]. Microelectronics Reliability 46(12): 2160 (2006) |
| 1 | EE | Charles S. Whitman, Terri M. Gilbert, Ann M. Rahn, Jennifer A. Antonell: Determining factors affecting ESD failure voltage using DOE. Microelectronics Reliability 46(8): 1228-1237 (2006) |
| 1 | Jennifer A. Antonell | [1] [2] |
| 2 | Ann M. Rahn | [1] [2] |
| 3 | Charles S. Whitman | [1] [2] |