Michael Meeder

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2005

1 EE Charles S. Whitman, Michael Meeder: Determining constant voltage lifetimes for silicon nitride capacitors in a GaAs IC process by a step stress method. Microelectronics Reliability 45(12): 1882-1893 (2005)

2005
1	EE	Charles S. Whitman, Michael Meeder: Determining constant voltage lifetimes for silicon nitride capacitors in a GaAs IC process by a step stress method. Microelectronics Reliability 45(12): 1882-1893 (2005)

Coauthor Index

1 Charles S. Whitman [1]