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1998 | ||
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1 | EE | Ivo Schanstra, Dharmajaya Lukita, A. J. van de Goor, Kees Veelenturf, Paul J. van Wijnen: Semiconductor manufacturing process monitoring using built-in self-test for embedded memories. ITC 1998: 872- |
1 | A. J. van de Goor | [1] |
2 | Ivo Schanstra | [1] |
3 | Kees Veelenturf | [1] |
4 | Paul J. van Wijnen | [1] |