2003 | ||
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3 | EE | Hong-Chou Kao, Ming-Fu Tsai, Shi-Yu Huang, Cheng-Wen Wu, Wen-Feng Chang, Shyue-Kung Lu: Efficient Double Fault Diagnosis for CMOS Logic Circuits With a Specific Application to Generic Bridging Faults. J. Inf. Sci. Eng. 19(4): 571-587 (2003) |
2002 | ||
2 | EE | Kuo-Liang Cheng, Ming-Fu Tsai, Cheng-Wen Wu: Neighborhood pattern-sensitive fault testing and diagnostics for random-access memories. IEEE Trans. on CAD of Integrated Circuits and Systems 21(11): 1328-1336 (2002) |
2001 | ||
1 | EE | Kuo-Liang Cheng, Ming-Fu Tsai, Cheng-Wen Wu: Efficient Neighborhood Pattern-Sensitive Fault Test Algorithms for Semiconductor Memories. VTS 2001: 225-230 |
1 | Wen-Feng Chang | [3] |
2 | Kuo-Liang Cheng | [1] [2] |
3 | Shi-Yu Huang | [3] |
4 | Hong-Chou Kao | [3] |
5 | Shyue-Kung Lu | [3] |
6 | Cheng-Wen Wu | [1] [2] [3] |