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Koji Saga

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2001
2EEToshinobu Ono, Akira Kozawa, Takashi Kimura, Yoshihiro Konno, Koji Saga: An Application of Partial Scan Techniques to a High-End System LSI Design. Asian Test Symposium 2001: 459
1996
1EEYoshihiro Konno, Kazushi Nakamura, Tatsushige Bitoh, Koji Saga, Seiken Yano: A Consistent Scan Design System for Large-Scale ASICs. Asian Test Symposium 1996: 82-87

Coauthor Index

1Tatsushige Bitoh [1]
2Takashi Kimura [2]
3Yoshihiro Konno [1] [2]
4Akira Kozawa [2]
5Kazushi Nakamura [1]
6Toshinobu Ono [2]
7Seiken Yano [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)