Koji Saga

2001
2	EE	Toshinobu Ono, Akira Kozawa, Takashi Kimura, Yoshihiro Konno, Koji Saga: An Application of Partial Scan Techniques to a High-End System LSI Design. Asian Test Symposium 2001: 459
1996
1	EE	Yoshihiro Konno, Kazushi Nakamura, Tatsushige Bitoh, Koji Saga, Seiken Yano: A Consistent Scan Design System for Large-Scale ASICs. Asian Test Symposium 1996: 82-87

Coauthor Index

1	Tatsushige Bitoh	[1]
2	Takashi Kimura	[2]
3	Yoshihiro Konno	[1] [2]
4	Akira Kozawa	[2]
5	Kazushi Nakamura	[1]
6	Toshinobu Ono	[2]
7	Seiken Yano	[1]