| |
| 1996 | ||
|---|---|---|
| 2 | EE | Yoshihiro Konno, Kazushi Nakamura, Tatsushige Bitoh, Koji Saga, Seiken Yano: A Consistent Scan Design System for Large-Scale ASICs. Asian Test Symposium 1996: 82-87 |
| 1987 | ||
| 1 | EE | Shigenobu Suzuki, Tatsushige Bitoh, Masao Kakimoto, Kazutoshi Takahashi, Takao Sugimoto: TRIP: An Automated Technology Mapping System. DAC 1987: 523-529 |
| 1 | Masao Kakimoto | [1] |
| 2 | Yoshihiro Konno | [2] |
| 3 | Kazushi Nakamura | [2] |
| 4 | Koji Saga | [2] |
| 5 | Takao Sugimoto | [1] |
| 6 | Shigenobu Suzuki | [1] |
| 7 | Kazutoshi Takahashi | [1] |
| 8 | Seiken Yano | [2] |