| |
| 1996 | ||
|---|---|---|
| 2 | EE | Yoshihiro Konno, Kazushi Nakamura, Tatsushige Bitoh, Koji Saga, Seiken Yano: A Consistent Scan Design System for Large-Scale ASICs. Asian Test Symposium 1996: 82-87 |
| 1995 | ||
| 1 | EE | Seiken Yano: Unified scan design with scannable memory arrays. Asian Test Symposium 1995: 153-159 |
| 1 | Tatsushige Bitoh | [2] |
| 2 | Yoshihiro Konno | [2] |
| 3 | Kazushi Nakamura | [2] |
| 4 | Koji Saga | [2] |