| |
| 2001 | ||
|---|---|---|
| 1 | EE | Toshinobu Ono, Akira Kozawa, Takashi Kimura, Yoshihiro Konno, Koji Saga: An Application of Partial Scan Techniques to a High-End System LSI Design. Asian Test Symposium 2001: 459 |
| 1 | Takashi Kimura | [1] |
| 2 | Yoshihiro Konno | [1] |
| 3 | Toshinobu Ono | [1] |
| 4 | Koji Saga | [1] |