| 2007 |
|---|
| 4 | EE | Heiko Ludwig,
John Hogan,
Rajesh Jaluka,
David Loewenstern,
Santhosh Kumaran,
Allen Gilbert,
Arijit Roy,
Thirumal R. Nellutla,
Maheswaran Surendra:
Catalog-based service request management.
IBM Systems Journal 46(3): 531-548 (2007) |
| 2006 |
|---|
| 3 | EE | Arijit Roy,
Cher Ming Tan:
Experimental investigation on the impact of stress free temperature on the electromigration performance of copper dual damascene submicron interconnect.
Microelectronics Reliability 46(9-11): 1652-1656 (2006) |
| 2005 |
|---|
| 2 | EE | Arijit Roy,
Cher Ming Tan,
Rakesh Kumar,
Xian Tong Chen:
Effect of test condition and stress free temperature on the electromigration failure of Cu dual damascene submicron interconnect line-via test structures.
Microelectronics Reliability 45(9-11): 1443-1448 (2005) |
| 1 | EE | Cher Ming Tan,
Arijit Roy,
Kok Tong Tan,
Derek Sim Kwang Ye,
Frankie Low:
Effect of vacuum break after the barrier layer deposition on the electromigration performance of aluminum based line interconnects.
Microelectronics Reliability 45(9-11): 1449-1454 (2005) |
