| |
| 2006 | ||
|---|---|---|
| 2 | EE | Cher Ming Tan, Wei Li, Kok Tong Tan, Frankie Low: Development of highly accelerated electromigration test. Microelectronics Reliability 46(9-11): 1638-1642 (2006) |
| 2005 | ||
| 1 | EE | Cher Ming Tan, Arijit Roy, Kok Tong Tan, Derek Sim Kwang Ye, Frankie Low: Effect of vacuum break after the barrier layer deposition on the electromigration performance of aluminum based line interconnects. Microelectronics Reliability 45(9-11): 1449-1454 (2005) |
| 1 | Wei Li | [2] |
| 2 | Frankie Low | [1] [2] |
| 3 | Arijit Roy | [1] |
| 4 | Cher Ming Tan | [1] [2] |
| 5 | Derek Sim Kwang Ye | [1] |