| |
| 2005 | ||
|---|---|---|
| 1 | EE | Cher Ming Tan, Arijit Roy, Kok Tong Tan, Derek Sim Kwang Ye, Frankie Low: Effect of vacuum break after the barrier layer deposition on the electromigration performance of aluminum based line interconnects. Microelectronics Reliability 45(9-11): 1449-1454 (2005) |
| 1 | Frankie Low | [1] |
| 2 | Arijit Roy | [1] |
| 3 | Cher Ming Tan | [1] |
| 4 | Kok Tong Tan | [1] |