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Derek Sim Kwang Ye

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2005
1EECher Ming Tan, Arijit Roy, Kok Tong Tan, Derek Sim Kwang Ye, Frankie Low: Effect of vacuum break after the barrier layer deposition on the electromigration performance of aluminum based line interconnects. Microelectronics Reliability 45(9-11): 1449-1454 (2005)

Coauthor Index

1Frankie Low [1]
2Arijit Roy [1]
3Cher Ming Tan [1]
4Kok Tong Tan [1]

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