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B. De Masi

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2005
2EEE. Ferraris, B. De Masi, M. Del Sarto: Polysilicon Fatigue Test-Bed Monitoring Based on the 2nd Harmonic of the Device Current Measurement. ICMENS 2005: 55-60
1EEF. Cacchione, A. Corigliano, B. De Masi, C. Riva: Out of plane vs in plane flexural behaviour of thin polysilicon films: Mechanical characterization and application of the Weibull approach. Microelectronics Reliability 45(9-11): 1758-1763 (2005)

Coauthor Index

1F. Cacchione [1]
2A. Corigliano [1]
3E. Ferraris [2]
4C. Riva [1]
5M. Del Sarto [2]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)