B. De Masi

2005
2	EE	E. Ferraris, B. De Masi, M. Del Sarto: Polysilicon Fatigue Test-Bed Monitoring Based on the 2nd Harmonic of the Device Current Measurement. ICMENS 2005: 55-60
1	EE	F. Cacchione, A. Corigliano, B. De Masi, C. Riva: Out of plane vs in plane flexural behaviour of thin polysilicon films: Mechanical characterization and application of the Weibull approach. Microelectronics Reliability 45(9-11): 1758-1763 (2005)

Coauthor Index

1	F. Cacchione	[1]
2	A. Corigliano	[1]
3	E. Ferraris	[2]
4	C. Riva	[1]
5	M. Del Sarto	[2]

Colors in the list of coauthors