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| 2005 | ||
|---|---|---|
| 1 | EE | F. Cacchione, A. Corigliano, B. De Masi, C. Riva: Out of plane vs in plane flexural behaviour of thin polysilicon films: Mechanical characterization and application of the Weibull approach. Microelectronics Reliability 45(9-11): 1758-1763 (2005) |
| 1 | A. Corigliano | [1] |
| 2 | B. De Masi | [1] |
| 3 | C. Riva | [1] |