| |
| 2007 | ||
|---|---|---|
| 1 | EE | Lei Ma, Geert Seuren, Robert Van Rijsinge, Corné Bastiaansen, Leon van der Dussen: A Design-Based Structural Test Method for a Switched-Resistor DAC. J. Electronic Testing 23(6): 559-567 (2007) |
| 1 | Leon van der Dussen | [1] |
| 2 | Lei Ma | [1] |
| 3 | Robert Van Rijsinge | [1] |
| 4 | Geert Seuren | [1] |