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Corné Bastiaansen

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2007
1EELei Ma, Geert Seuren, Robert Van Rijsinge, Corné Bastiaansen, Leon van der Dussen: A Design-Based Structural Test Method for a Switched-Resistor DAC. J. Electronic Testing 23(6): 559-567 (2007)

Coauthor Index

1Leon van der Dussen [1]
2Lei Ma [1]
3Robert Van Rijsinge [1]
4Geert Seuren [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)