| |
| 2007 | ||
|---|---|---|
| 3 | EE | Lei Ma, Geert Seuren, Robert Van Rijsinge, Corné Bastiaansen, Leon van der Dussen: A Design-Based Structural Test Method for a Switched-Resistor DAC. J. Electronic Testing 23(6): 559-567 (2007) |
| 2004 | ||
| 2 | EE | Geert Seuren, Tom Waayers: Extending the Digital Core-based Test Methodology to Support Mixed-Signal. ITC 2004: 281-289 |
| 1993 | ||
| 1 | R. Mehtani, B. Atzema, M. De Jonghe, Richard Morren, Geert Seuren, Taco Zwemstra: Mix Test: A Mixed-Signal Extension to a Digital Test System. ITC 1993: 945-953 | |
| 1 | B. Atzema | [1] |
| 2 | Corné Bastiaansen | [3] |
| 3 | Leon van der Dussen | [3] |
| 4 | M. De Jonghe | [1] |
| 5 | Lei Ma | [3] |
| 6 | R. Mehtani | [1] |
| 7 | Richard Morren | [1] |
| 8 | Robert Van Rijsinge | [3] |
| 9 | Tom Waayers | [2] |
| 10 | Taco Zwemstra | [1] |