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Geert Seuren

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2007
3EELei Ma, Geert Seuren, Robert Van Rijsinge, Corné Bastiaansen, Leon van der Dussen: A Design-Based Structural Test Method for a Switched-Resistor DAC. J. Electronic Testing 23(6): 559-567 (2007)
2004
2EEGeert Seuren, Tom Waayers: Extending the Digital Core-based Test Methodology to Support Mixed-Signal. ITC 2004: 281-289
1993
1 R. Mehtani, B. Atzema, M. De Jonghe, Richard Morren, Geert Seuren, Taco Zwemstra: Mix Test: A Mixed-Signal Extension to a Digital Test System. ITC 1993: 945-953

Coauthor Index

1B. Atzema [1]
2Corné Bastiaansen [3]
3Leon van der Dussen [3]
4M. De Jonghe [1]
5Lei Ma [3]
6R. Mehtani [1]
7Richard Morren [1]
8Robert Van Rijsinge [3]
9Tom Waayers [2]
10Taco Zwemstra [1]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)