| 2003 |
|---|
| 4 | EE | Zaid Al-Ars,
A. J. van de Goor,
Jens Braun,
Detlev Richter:
Optimizing Stresses for Testing DRAM Cell Defects Using Electrical Simulation.
DATE 2003: 10484-10489 |
| 2001 |
|---|
| 3 | EE | Zaid Al-Ars,
A. J. van de Goor,
Jens Braun,
Detlev Richter:
A Memory Specific Notation for Fault Modeling.
Asian Test Symposium 2001: 43- |
| 2 | | Zaid Al-Ars,
A. J. van de Goor,
Jens Braun,
Detlev Richter:
Simulation based analysis of temperature effect on the faulty behavior of embedded DRAMs.
ITC 2001: 783-792 |
| 1998 |
|---|
| 1 | EE | Roderick McConnell,
Udo Möller,
Detlev Richter:
How we test Siemens Embedded DRAM Cores.
ITC 1998: 1120- |
