Jens Braun

2003
3	EE	Zaid Al-Ars, A. J. van de Goor, Jens Braun, Detlev Richter: Optimizing Stresses for Testing DRAM Cell Defects Using Electrical Simulation. DATE 2003: 10484-10489
2001
2	EE	Zaid Al-Ars, A. J. van de Goor, Jens Braun, Detlev Richter: A Memory Specific Notation for Fault Modeling. Asian Test Symposium 2001: 43-
1		Zaid Al-Ars, A. J. van de Goor, Jens Braun, Detlev Richter: Simulation based analysis of temperature effect on the faulty behavior of embedded DRAMs. ITC 2001: 783-792

Coauthor Index

1	Zaid Al-Ars	[1] [2] [3]
2	A. J. van de Goor	[1] [2] [3]
3	Detlev Richter	[1] [2] [3]