| |
| 2003 | ||
|---|---|---|
| 5 | EE | Martin Schrader, Roderick McConnell: SoC Design and Test Considerations. DATE 2003: 20202-20207 |
| 2001 | ||
| 4 | Roderick McConnell, Rochit Rajsuman, Eric A. Nelson, Jeffrey Dreibelbis: Test and repair of large embedded DRAMs. I. ITC 2001: 163-172 | |
| 3 | Eric A. Nelson, Jeffrey Dreibelbis, Roderick McConnell: Test and repair of large embedded DRAMs. 2. ITC 2001: 173-181 | |
| 1998 | ||
| 2 | EE | Roderick McConnell, Udo Möller, Detlev Richter: How we test Siemens Embedded DRAM Cores. ITC 1998: 1120- |
| 1996 | ||
| 1 | EE | Roderick McConnell, Dominique Lavenier: Prototyping of VLSI components from a formal specification. VLSI Signal Processing 12(2): 177-186 (1996) |
| 1 | Jeffrey Dreibelbis | [3] [4] |
| 2 | Dominique Lavenier | [1] |
| 3 | Udo Möller | [2] |
| 4 | Eric A. Nelson | [3] [4] |
| 5 | Rochit Rajsuman | [4] |
| 6 | Detlev Richter | [2] |
| 7 | Martin Schrader | [5] |