| 2000 |
| 4 | EE | Robert L. Wisnieff,
John J. Ritsko:
Electronic displays for information technology.
IBM Journal of Research and Development 44(3): 409-422 (2000) |
| 1998 |
| 3 | EE | Evan G. Colgan,
Paul M. Alt,
Robert L. Wisnieff,
Peter M. Fryer,
Eileen A. Galligan,
William S. Graham,
Paul F. Greier,
Raymond R. Horton,
Harold Ifill,
Leslie C. Jenkins,
Richard A. John,
Richard I. Kaufman,
Yue Kuo,
Alphonso P. Lanzetta,
Kenneth F. Latzko,
Frank R. Libsch,
Shui-Chih Alan Lien,
Steven E. Millman,
Robert W. Nywening,
Robert J. Polastre,
Carl G. Powell,
Rick A. Rand,
John J. Ritsko,
Mary B. Rothwell,
John L. Staples,
Kevin W. Warren,
John S. Wilson,
Steven L. Wright:
A 10.5-in.-diagonal SXGA active-matrix display.
IBM Journal of Research and Development 42(3): 427-444 (1998) |
| 2 | EE | Evan G. Colgan,
Robert J. Polastre,
Masatomo Takeichi,
Robert L. Wisnieff:
Thin-film-transistor process-characterization test structures.
IBM Journal of Research and Development 42(3): 481-490 (1998) |
| 1992 |
| 1 | | Leslie C. Jenkins,
Robert J. Polastre,
Ronald R. Troutman,
Robert L. Wisnieff:
Functional testing of TFT/LCD arrays.
IBM Journal of Research and Development 36(1): 59-68 (1992) |