| |
| 2001 | ||
|---|---|---|
| 3 | EE | M. Porti, X. Blasco, M. Nafría, X. Aymerich, Alexander Olbrich, Bernd Ebersberger: Local current fluctuations before and after breakdown of thin SiO2 films observed with conductive atomic force microscope. Microelectronics Reliability 41(7): 1041-1044 (2001) |
| 2 | EE | Bernd Ebersberger, Alexander Olbrich, Christian Boit: Scanning probe microscopy in semiconductor failure analysis. Microelectronics Reliability 41(8): 1231-1236 (2001) |
| 1 | Bernd Ebersberger, Alexander Olbrich, Christian Boit: Application of Scanning Probe Microscopy techniques in Semiconductor Failure Analysis. Microelectronics Reliability 41(9-10): 1449-1458 (2001) | |
| 1 | X. Aymerich | [3] |
| 2 | X. Blasco | [3] |
| 3 | Christian Boit | [1] [2] |
| 4 | Bernd Ebersberger | [1] [2] [3] |
| 5 | M. Nafría | [3] |
| 6 | M. Porti | [3] |