| 2001 |
|---|
| 4 | EE | Uwe Cantner,
Bernd Ebersberger,
Horst Hanusch,
Jens J. Krüger,
Andreas Pyka:
Empirically Based Simulation: The Case of Twin Peaks in National Income.
J. Artificial Societies and Social Simulation 4(3): (2001) |
| 3 | EE | M. Porti,
X. Blasco,
M. Nafría,
X. Aymerich,
Alexander Olbrich,
Bernd Ebersberger:
Local current fluctuations before and after breakdown of thin SiO2 films observed with conductive atomic force microscope.
Microelectronics Reliability 41(7): 1041-1044 (2001) |
| 2 | EE | Bernd Ebersberger,
Alexander Olbrich,
Christian Boit:
Scanning probe microscopy in semiconductor failure analysis.
Microelectronics Reliability 41(8): 1231-1236 (2001) |
| 1 | | Bernd Ebersberger,
Alexander Olbrich,
Christian Boit:
Application of Scanning Probe Microscopy techniques in Semiconductor Failure Analysis.
Microelectronics Reliability 41(9-10): 1449-1458 (2001) |
