![]() | ![]() |
2006 | ||
---|---|---|
2 | EE | Takashi Ohzone, Kazuhiko Okada, Takayuki Morishita, Kiyotaka Komoku, Toshihiro Matsuda, Hideyuki Iwata: A Test Structure to Analyze Highly-Doped-Drain and Lightly-Doped-Drain in CMOSFET. IEICE Transactions 89-C(9): 1351-1357 (2006) |
1986 | ||
1 | Masato Suyama, Kazuhiko Okada, Seiichi Nakajima: Impact of ISDN on Networks Configuration. ICC 1986: 397-401 |
1 | Hideyuki Iwata | [2] |
2 | Kiyotaka Komoku | [2] |
3 | Toshihiro Matsuda | [2] |
4 | Takayuki Morishita | [2] |
5 | Seiichi Nakajima | [1] |
6 | Takashi Ohzone | [2] |
7 | Masato Suyama | [1] |