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| 2006 | ||
|---|---|---|
| 2 | EE | Takashi Ohzone, Kazuhiko Okada, Takayuki Morishita, Kiyotaka Komoku, Toshihiro Matsuda, Hideyuki Iwata: A Test Structure to Analyze Highly-Doped-Drain and Lightly-Doped-Drain in CMOSFET. IEICE Transactions 89-C(9): 1351-1357 (2006) |
| 1986 | ||
| 1 | Masato Suyama, Kazuhiko Okada, Seiichi Nakajima: Impact of ISDN on Networks Configuration. ICC 1986: 397-401 | |
| 1 | Hideyuki Iwata | [2] |
| 2 | Kiyotaka Komoku | [2] |
| 3 | Toshihiro Matsuda | [2] |
| 4 | Takayuki Morishita | [2] |
| 5 | Seiichi Nakajima | [1] |
| 6 | Takashi Ohzone | [2] |
| 7 | Masato Suyama | [1] |