| |
| 2007 | ||
|---|---|---|
| 1 | EE | Takashi Ohzone, Eiji Ishii, Takayuki Morishita, Kiyotaka Komoku, Toshihiro Matsuda, Hideyuki Iwata: A Test Structure to Analyze Electrical CMOSFET Reliabilities between Center and Edge along the Channel Width. IEICE Transactions 90-C(2): 515-522 (2007) |
| 1 | Hideyuki Iwata | [1] |
| 2 | Kiyotaka Komoku | [1] |
| 3 | Toshihiro Matsuda | [1] |
| 4 | Takayuki Morishita | [1] |
| 5 | Takashi Ohzone | [1] |