| 2007 |
|---|
| 3 | EE | Takashi Ohzone,
Eiji Ishii,
Takayuki Morishita,
Kiyotaka Komoku,
Toshihiro Matsuda,
Hideyuki Iwata:
A Test Structure to Analyze Electrical CMOSFET Reliabilities between Center and Edge along the Channel Width.
IEICE Transactions 90-C(2): 515-522 (2007) |
| 2 | EE | Takashi Ohzone,
Tatsuaki Sadamoto,
Takayuki Morishita,
Kiyotaka Komoku,
Toshihiro Matsuda,
Hideyuki Iwata:
A CMOS Temperature Sensor Circuit.
IEICE Transactions 90-C(4): 895-902 (2007) |
| 2006 |
|---|
| 1 | EE | Takashi Ohzone,
Kazuhiko Okada,
Takayuki Morishita,
Kiyotaka Komoku,
Toshihiro Matsuda,
Hideyuki Iwata:
A Test Structure to Analyze Highly-Doped-Drain and Lightly-Doped-Drain in CMOSFET.
IEICE Transactions 89-C(9): 1351-1357 (2006) |
