| |
| 2002 | ||
|---|---|---|
| 1 | EE | Minh Quach, Tuan Pham, Tim Figal, Bob Kopitzke, Pete O'Neill: Wafer-Level Defect-Based Testing Using Enhanced Voltage Stress and Statistical Test Data Evaluation. ITC 2002: 683-692 |
| 1 | Tim Figal | [1] |
| 2 | Pete O'Neill | [1] |
| 3 | Tuan Pham | [1] |
| 4 | Minh Quach | [1] |