Wataru Mizubayashi

2005
2	EE	Hideki Murakami, Wataru Mizubayashi, Hirokazu Yokoi, Atsushi Suyama, Seiichi Miyazaki: Electrical Characterization of Aluminum-Oxynitride Stacked Gate Dielectrics Prepared by a Layer-by-Layer Process of Chemical Vapor Deposition and Rapid Thermal Nitridation. IEICE Transactions 88-C(4): 640-645 (2005)
1	EE	Wataru Mizubayashi, Naoki Yasuda, Kenji Okada, Hiroyuki Ota, Hirokazu Hisamatsu, Kunihiko Iwamoto, Koji Tominaga, Katsuhiko Yamamoto, Tsuyoshi Horikawa, Toshihide Nabatame: Carrier separation analysis for clarifying carrier conduction and degradation mechanisms in high-k stack gate dielectrics. Microelectronics Reliability 45(7-8): 1041-1050 (2005)

Coauthor Index

1	Hirokazu Hisamatsu	[1]
2	Tsuyoshi Horikawa	[1]
3	Kunihiko Iwamoto	[1]
4	Seiichi Miyazaki	[2]
5	Hideki Murakami	[2]
6	Toshihide Nabatame	[1]
7	Kenji Okada	[1]
8	Hiroyuki Ota	[1]
9	Atsushi Suyama	[2]
10	Koji Tominaga	[1]
11	Katsuhiko Yamamoto	[1]
12	Naoki Yasuda	[1]
13	Hirokazu Yokoi	[2]

Colors in the list of coauthors