Hiroyuki Ota

2005
1	EE	Wataru Mizubayashi, Naoki Yasuda, Kenji Okada, Hiroyuki Ota, Hirokazu Hisamatsu, Kunihiko Iwamoto, Koji Tominaga, Katsuhiko Yamamoto, Tsuyoshi Horikawa, Toshihide Nabatame: Carrier separation analysis for clarifying carrier conduction and degradation mechanisms in high-k stack gate dielectrics. Microelectronics Reliability 45(7-8): 1041-1050 (2005)

Coauthor Index

1	Hirokazu Hisamatsu	[1]
2	Tsuyoshi Horikawa	[1]
3	Kunihiko Iwamoto	[1]
4	Wataru Mizubayashi	[1]
5	Toshihide Nabatame	[1]
6	Kenji Okada	[1]
7	Koji Tominaga	[1]
8	Katsuhiko Yamamoto	[1]
9	Naoki Yasuda	[1]