2005 | ||
---|---|---|
2 | EE | Wataru Mizubayashi, Naoki Yasuda, Kenji Okada, Hiroyuki Ota, Hirokazu Hisamatsu, Kunihiko Iwamoto, Koji Tominaga, Katsuhiko Yamamoto, Tsuyoshi Horikawa, Toshihide Nabatame: Carrier separation analysis for clarifying carrier conduction and degradation mechanisms in high-k stack gate dielectrics. Microelectronics Reliability 45(7-8): 1041-1050 (2005) |
2004 | ||
1 | EE | Masatoshi Ohishi, Yoshihiko Mizumoto, Naoki Yasuda, Yuji Shirasaki, Masahiro Tanaka, Satoshi Honda, Yoshifumi Masunaga: A Prototype toward Japanese Virtual Observatory (JVO). SAINT Workshops 2004: 591-595 |
1 | Hirokazu Hisamatsu | [2] |
2 | Satoshi Honda | [1] |
3 | Tsuyoshi Horikawa | [2] |
4 | Kunihiko Iwamoto | [2] |
5 | Yoshifumi Masunaga | [1] |
6 | Wataru Mizubayashi | [2] |
7 | Yoshihiko Mizumoto | [1] |
8 | Toshihide Nabatame | [2] |
9 | Masatoshi Ohishi | [1] |
10 | Kenji Okada | [2] |
11 | Hiroyuki Ota | [2] |
12 | Yuji Shirasaki | [1] |
13 | Masahiro Tanaka | [1] |
14 | Koji Tominaga | [2] |
15 | Katsuhiko Yamamoto | [2] |