| |
| 1997 | ||
|---|---|---|
| 1 | EE | Katsuyoshi Miura, Kohei Nakata, Koji Nakamae, Hiromu Fujioka: Automatic EB Fault Tracing System by Successive Circuit Extraction from VLSI CAD Layout Data. Asian Test Symposium 1997: 162-167 |
| 1 | Hiromu Fujioka | [1] |
| 2 | Katsuyoshi Miura | [1] |
| 3 | Koji Nakamae | [1] |