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E. Misra

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2006
2EEE. Misra, N. D. Theodore, J. W. Mayer, T. L. Alford: Failure mechanisms of pure silver, pure aluminum and silver-aluminum alloy under high current stress. Microelectronics Reliability 46(12): 2096-2103 (2006)
2005
1EEE. Misra, Md M. Islam, Mahbub Hasan, H. C. Kim, T. L. Alford: Percolative approach for failure time prediction of thin film interconnects under high current stress. Microelectronics Reliability 45(2): 391-395 (2005)

Coauthor Index

1T. L. Alford [1] [2]
2Mahbub Hasan [1]
3Md M. Islam [1]
4H. C. Kim [1]
5J. W. Mayer [2]
6N. D. Theodore [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)