| 2005 |
|---|
| 3 | EE | E. Misra,
Md M. Islam,
Mahbub Hasan,
H. C. Kim,
T. L. Alford:
Percolative approach for failure time prediction of thin film interconnects under high current stress.
Microelectronics Reliability 45(2): 391-395 (2005) |
| 2002 |
|---|
| 2 | EE | Mahbub Hasan,
David R. Allee,
M. Kabir,
K. Rahman:
A 15-bit CMOS cyclic A/D converter with correlated double sampling.
ISCAS (1) 2002: 497-500 |
| 2000 |
|---|
| 1 | EE | Mahbub Hasan,
Huan-Hsiang Patrick Shen,
David R. Allee,
Michael J. Pennell:
A behavioral model of a 1.8-V flash A/D converter based on deviceparameters.
IEEE Trans. on CAD of Integrated Circuits and Systems 19(1): 69-82 (2000) |
