2006 | ||
---|---|---|
1 | EE | E. Misra, N. D. Theodore, J. W. Mayer, T. L. Alford: Failure mechanisms of pure silver, pure aluminum and silver-aluminum alloy under high current stress. Microelectronics Reliability 46(12): 2096-2103 (2006) |
1 | T. L. Alford | [1] |
2 | J. W. Mayer | [1] |
3 | E. Misra | [1] |