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N. D. Theodore

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2006
1EEE. Misra, N. D. Theodore, J. W. Mayer, T. L. Alford: Failure mechanisms of pure silver, pure aluminum and silver-aluminum alloy under high current stress. Microelectronics Reliability 46(12): 2096-2103 (2006)

Coauthor Index

1T. L. Alford [1]
2J. W. Mayer [1]
3E. Misra [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)