S. Matsuda

2005
2	EE	K. Hayama, K. Takakura, H. Ohyama, S. Kuboyama, S. Matsuda, J. M. Rafí, A. Mercha, E. Simoen, C. Claeys: Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs. Microelectronics Reliability 45(9-11): 1376-1381 (2005)
1987
1		F. Itoh, K. Shimakawa, K. Togo, S. Matsuda, H. Itoh: Design, Implementation, and Evaluation of a Relational Database Engine for Variable Length Records. IWDM 1987: 269-282

Coauthor Index

1	C. Claeys	[2]
2	K. Hayama	[2]
3	F. Itoh	[1]
4	H. Itoh	[1]
5	S. Kuboyama	[2]
6	A. Mercha	[2]
7	H. Ohyama	[2]
8	J. M. Rafí	[2]
9	K. Shimakawa	[1]
10	E. Simoen	[2]
11	K. Takakura	[2]
12	K. Togo	[1]

Colors in the list of coauthors