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2005 | ||
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1 | EE | K. Hayama, K. Takakura, H. Ohyama, S. Kuboyama, S. Matsuda, J. M. Rafí, A. Mercha, E. Simoen, C. Claeys: Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs. Microelectronics Reliability 45(9-11): 1376-1381 (2005) |
1 | C. Claeys | [1] |
2 | K. Hayama | [1] |
3 | S. Matsuda | [1] |
4 | A. Mercha | [1] |
5 | H. Ohyama | [1] |
6 | J. M. Rafí | [1] |
7 | E. Simoen | [1] |
8 | K. Takakura | [1] |