S. Kuboyama

2005
1	EE	K. Hayama, K. Takakura, H. Ohyama, S. Kuboyama, S. Matsuda, J. M. Rafí, A. Mercha, E. Simoen, C. Claeys: Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs. Microelectronics Reliability 45(9-11): 1376-1381 (2005)

Coauthor Index

1	C. Claeys	[1]
2	K. Hayama	[1]
3	S. Matsuda	[1]
4	A. Mercha	[1]
5	H. Ohyama	[1]
6	J. M. Rafí	[1]
7	E. Simoen	[1]
8	K. Takakura	[1]